Multiple use of target parameters (columns) in on demand settings

If you need to query data from a (really) large table where some information should come from source table A (and marking A) and others come from table B (and marking B) then it would be very helpful.

Imagine a table A which contains wafers and context informations about tests.

TimeStamp WaferName Temp Any....Marking
2026-10-09 01:00 A1 RT a *
2026-10-09 01:30 A2 RT b *
2026-10-09 01:59 A2 RT c *
2026-10-10 02:00 A1 HT d
2026-10-10 01:31 A2 HT e
2026-10-10 01:58 A3 HT f
2026-10-10 02:31 A3 HT g
... 10.000 lines, different Wafers, RT/HT

User has marked three lines as he looks for RT only.

Further imagine table B containing some (marked) dies (out of millions) where the user wants collect information for.

WaferName DX DY Marking
A1 -1 23 *
A1 -3 34 *
A2 -6 30 *
A2 34 12 *
A3 -4 2
.... 10 Million lines of different dies

Then imagine a third table to query from. That table contains billion of lines but limited amount of columns (no Temp). Partition is by TimeStamp, therefore it is required to provide one but unfortunately we do not know which die was measured at what time.

Result should contain 4 lines only.

TimeStamp WaferName DX DY Result Retrieve
2026-10-09 01:00 A1 -1 23 0.123 yes
2026-10-10 02:00 A1 -1 23 0.123 no
2026-10-09 01:00 A1 -3 34 0.234 yes
2026-10-10 02:00 A1 -3 34 0.234 no
2026-10-09 01:30 A2 -6 30 1.123 yes
2026-10-09 01:59 A2 34 12 0.987 yes

User should easily do some interactive work by marking diferent dies (B) or measurements (A).

Currently it is quite difficult. I could join Table A and B together but finally it would result in billions of lines (to query 4 result lines :-)

Using one parameter (wafer) twice in on demand setting would make it much easier.

I could query for

( (Timestamp = A.TimeStamp) and (WaferName = A.WaferName) ) * Marking_A

and

( (WaferName = B.WaferName) and (DX = B.DX) and (DY = B.DY) ) * Marking_B

To do so I need the possibility to twice select WaferName as on demand parameter